Snapshot Generalized Ellipsometer
Advantages
- Instantaneous Acquisition: Captures the 9 elements of the Mueller matrix in a single-shot exposure. This enables millisecond-level temporal resolution, making it the ideal solution for real-time monitoring.
- High-Efficiency Algebraic Inversion Method: Employs a robust algebraic analytical method for the direct extraction of the Mueller matrix that eliminates the need for Fourier transform-based demodulation.
- Mechanical-Free Stability and Robustness: Replaces rotating components with static high-order retarders for superior mechanical reliability.
- Ultra-Compact Footprint for In-Situ Integration: Features a streamlined design that significantly reduces the system’s form factor. Provides maximum information density within a compact, robust, and streamlined package.
- Single-Motor Synchronized Variable-Angle Mechanism: Enables symmetric arm rotation while keeping samples stationary, providing continuous angle tuning ideal for large substrates or liquid surfaces.
Goal
Seeking industrial partners to license and/or exploit the technology.
Patent
International Patent Application
Priority date: May 2025
Reference
UBTT0527
Contact
Dr. Sancho Moro
Email: smoro@fbg.ub.edu
Snapshot Generalized Ellipsometer
Description
The Snapshot Generalized Ellipsometer (Fig. 1) is a compact, high-speed, robust, polarimetric instrument designed for the instantaneous characterization of complex optical media and nanostructures. By utilizing dual high-order retarders and algebraic inversion, the system enables the simultaneous acquisition of 9 elements of the Mueller matrix in a single shot. It eliminates the need for any moving parts and Fourier transform-based demodulation, offering a vibration-insensitive and high-throughput solution that provides superior polarimetric accuracy and speed. Besides, it includes a customized goniometric mechanism for dynamic multi-angle tasks.
Link to research group website
Current stage of development
TRL6: The system has already been developed and used to measure and analyze samples.